Author + information
- R. Corbisiero
Leads which exhibit externalized conductors (EC) may or may not require replacement at generator change. Techniques to identify potential electrical malfunction (EM) vary based on practice and include assessment of bipolar imp. (BIΩ), non-invasive impedance (NIΩ) high voltage test shock (HVSΩ).
Patient data (N=28) was analyzed comparing patients with HVSΩ (N=19) vs. NIΩ (N=9) to predict EM. BI Ω was also tracked in both groups. Implant data at the time of generator change and future follow-up data were included to determine electrical changes. Our endpoint was measurements indicating EM obtained during the post-surgery follow-up.
N=28 patients age 72+/12.4 consisting of 18M:10F were included. The HVSΩ group(N=19) had mean f/u of 9.23+/-2.4yrs. The NIΩ group(N=9) had mean f/u of 10.3+/-1.8yrs. Additional data in Table 1.
Both groups demonstrated similar characteristics including BI, NI, and RV threshold. HVS showed no benefit in predicting EM or revisions. Associated risks from anesthesia may outweigh predictive benefit of a test shock. Further analysis in a larger cohort may prove we alter practices when dealing with patients with EC.